MSCL-XRF: X-ray Fluorescence (XRF) spectroscopy and Multi-Sensor Core Logging
Geotek offer a range of specialised core scanning/logging equipment that use XRF spectrometers to acquire elemental abundance from the surface of sediment and rock cores. The ability to continuously scan core samples using both petrophysical and spectroscopic techniques is a unique product to Geotek. XRF spectrometers can now be integrated into new or existing MSCL systems.
A MSCL is the perfect platform to acquire XRF data as it offers a stable and repeatable measurement geometry with each measurement depth co-registered with other spectroscopy and petrophysical sensors. Geotek offer two XRF spectrometers: the high resolution and ultra-sensitive Geotek XRF, and the popular hand-held Olympus Delta, which are are compatible with a range of different MSCL systems including: the standard MSCL-S, the small footprint MSCL-XZ, and the multiple core/core box workstation MSCL-XYZ.
Applications of XRF Data
Nearly any geological, geochemical, or petrophysical application benefits from the ability to maximise data recovery from core material. Geotek’s MSCL systems achieve this by uniquely combining continuous downcore XRF with other spectroscopy and petrophysical measurements.
Oil and Gas/Unconventional
- Corroboration of downhole log elemental concentration
- Core to log integration and correlation
- Interpretation of mineralogy and matrix properties
- Linking core gamma ray with elemental content and density
- Identification of trace metals and ore identification
- Elemental abundances automatically stored and exported as ascii file
- Depth co-registration of elemental data with physical and magnetic properties for resource assessment
- Sediment provenance assessment
- Bed/unit correlation
- Characterisation of cement
- Derivation or proxy for mineral distribution
- Mass movement identification
- Elemental abundances used as a proxy for environmental change
- Identification of volcanic ash, or ice-rafted debris
- Characterisation of palaeosols and sediment/rock core samples
- 100 µm downcore logging resolution for high resolution climate change studies
- Identification of heavy metals
- Can be integrated with ultraviolet linescan imaging for hydrocarbon identification
- Field-based measurements
High Performance Geotek XRF Spectrometer
The ultra-sensitive Geotek X-ray fluorescence (XRF) spectrometer acquires precise elemental abundances from the surface of sediment and rock cores, and offers superior sensitivity for light elements.
- High performance large area silicon drift detector (SDD) with a helium-flushed measurement cell dramatically improves sensitivity, especially for the light elements such as Mg, Al, and Si
- Widest range of elements from Mg to U at ppm levels
- Motorised X-ray slits enable a downcore spatial resolution of 100 µm or less
- Sophisticated filter slide to lower detection limits across a wide range of elements, and allows different cross-core areas to be illuminated – perfect for high-resolution studies of dipping laminae
- Low power sealed X-ray source for long life (>10 000 hours) with no maintenance
- A unique close-coupled geometry for high efficiency at lower X-ray tube power
- Simple to use custom-designed software automatically communicates with the logger to acquire, interpret, and display the fluorescence spectra with element abundance during acquisition
- Precise measurements are assured through a combination of peak fit and deconvolution algorithms with a proprietary quantitative analysis suite
Geotek XRF Sensor Specifications
- X-ray source: 15W/50kV, Rh anode allowing sulfur detection, air-cooled
- X-ray detector: Canberra Silicon Drift Detector, 15mm2 or 80mm2, FWHM: ~160eV Mn Kα
- Spectral analysis: bAxil
- Elements detected: Mg to U
- Downcore resolution: 0.1 to 10 mm
- Crosscore slit width: 5, 10, or 15 mm
- Further specifications including limits of detection can be found in our XRF brochure
Olympus Delta XRF Spectrometer
Geotek have integrated one of the most popular hand-held XRF spectrometers on the market onto our MSCL systems: The Olympus Delta Professional (Delta XRF). Through limited operator involvement, custom-designed software seamlessly communicates with the Delta XRF to provide depth co-registered XRF data during logging acquisition. When mounted on the MSCL, the XRF sensor is counterbalanced with an adjustable weight so the instrument only lightly touches the surface when working with soft, plastic-wrapped split core.
Geotek utilise Olympus’s interpretation software to present the acquired spectra and automatically display the results during logging along side other chemical or physical property datasets. These data can then be easily exported as an ascii file for further analyses. Furthermore, the sensor can be detached, and used as a standard hand-held if required.
Sensor specifications for Olympus Delta handheld
Olympus Delta Professional handheld (http://www.olympus-ims.com/en/xrf-xrd/delta-handheld/delta-prof/)
Other compatible sensors
XRF data can be collected simultaneously with other split-core data, such as colour spectrophotometry and magnetic susceptibility. Split-core data can be easily co-registered with data collected on whole core (gamma density, P-wave velocity, magnetic susceptibility, electrical resistivity, natural gamma spectrometry). Geoscan IV linescan images or MSCL-XCT X-ray images can also be registered to XRF data with confidence.
For further information please contact us.
|Geotek MSCL-XRF Brochure.pdf||3.35 MB|